Erik Jan Marinissen <Erik . Jan . Marinissen @ philips . com> (email mangled to prevent spamming) Philips Research Laboratories VLSI Design Automation & Test Prof. Holstlaan 4 - WAY 4.083 5656 AA Eindhoven The Netherlands
Abstract:
The TECS Bibliography contains references to publications in the field of (1) manufacturing test and (2) design validation and debug of embedded-core based system chips.
Keywords:
IC (integrated circuit); embedded core; manufacturing test; design validation; debug
Author Comments:
References to general test and debug techniques, i.e., not in particular related to the topic of embedded cores and/or system chips, are NOT included.